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These pages provide an access point to data contained in CCFE published journal papers.  By selecting a paper, and then a specific figure or table, you can request the related underlying data if it is available for release.

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Publication Figures

Publication Date:
2019-11-25

First Author:
A. Hollingsworth

Title:
Comparative Study of Deuterium Retention in Irradiated Eurofer and Fe-Cr from a new Ion Implantation Materials Facility

Paper Identifier:
CP/19/162

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Figure Reference Title Description Number of Figure Data Items Identifier Download Figure Details
Figure1 Deuterium plasma exposure system after commissioning 0 CF/19/163 Download
Figure2 Piping and Instrumentation Diagram (P&ID) of deuterium exposure system 0 CF/19/164 Download
Figure3 An ellipsometry survey of an a-C:H foil exposed to 100 eV deuterium ions for 20 minutes. Region (i) shows approximately uniform erosion by the beam in the central area where the sample is located. Region (ii) shows where the left-hand retaining clip held the foil in place, and similarly the imprint of the right-hand clip can be seen to the right of the figure. Region (iii) shows where the top of the foil was shielded from the ion flux by a molybdenum foil shield and so the amount of erosion reduces sharply 0 CF/19/165 Download
Figure4 Photographs of commissioning plasmas. From left to right these are neon, helium, air and argon. The divergence of the ion beam can be observed. 0 CF/19/166 Download
Figure5 The ratio of ions incident on the inner and outer plates, providing an indication of beam divergence. The ratio of the areas of these plates is 0.7 0 CF/19/167 Download
Figure6 An example spectrum taken during the exposure of a sample using recirculating deuterium. The D? and D? lines can be seen at 486 nm and 656 nm respectively, along with the Fulcher band between 560 nm and 640 nm. This spectrum indicates no significant buildup of impurities caused by re-circulation of the deuterium through the plasma chamber, suggesting deuterium results can be compared with those from other systems which typically have a ‘once through’ setup and exhaust the deuterium from the exposure chamber. 0 CF/19/168 Download
Figure7 TDS spectra of deuterium and exposure charge in Eurofer samples with damage levels between 0 and 1 dpa. Time period between exposure to deuterium plasma and the TDS is 1 day for all samples. The lower limit of the charge incident on the sample is indicated. It can be seen that the retention is more strongly affected by the damage level than the ion fluence. 0 CF/19/169 Download
Figure8 SIMS depth profiling of deuterium content of damaged Eurofer samples. Irradiation doses: S6 – 0 dpa, S15 – 0.01 dpa, S27 – 0.1 dpa, and S33 – 1 dpa. Time delay between exposure to deuterium plasma and the SIMS is given in days. 0 CF/19/170 Download
Figure9a TEM in-situ pictures of Eurofer sample irradiated to 1 dpa. Initial microstructure (a) 0 CF/19/171 Download
Figure9b TEM in-situ pictures of Eurofer sample irradiated to 1 dpa. Initial microstructure (a), microstructure at 625°C indicating cavities formed along grain boundaries and precipitates by change of contrast (b,c). 0 CF/19/172 Download
Figure9c TEM in-situ pictures of Eurofer sample irradiated to 1 dpa. Initial microstructure (a), microstructure at 625°C indicating cavities formed along grain boundaries and precipitates by change of contrast (b,c). 0 CF/19/173 Download
Figure10 TDS spectra of deuterium in Fe-Cr samples with damage levels between 0 and 1 dpa. Irradiation doses: S128 – 0 dpa, S51 – 0.01 dpa, S57 – 0.1 dpa, and S64 – 1 dpa. 0 CF/19/174 Download
Figure11 SIMS depth profiling of deuterium content of damaged Fe-Cr samples. For S50, S56 and S62 the delays were 59, 55 and 57 days respectively. 0 CF/19/175 Download
Figure12 The total retention in Eurofer and Fe-Cr samples as a function of delay between exposure and analysis. 0 CF/19/176 Download

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