Published Data
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Publication Figures
Publication Date:
2019-11-25
First Author:
A. Hollingsworth
Title:
Comparative Study of Deuterium Retention in Irradiated Eurofer and Fe-Cr from a new Ion Implantation Materials Facility
Paper Identifier:
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| Figure Reference | Title | Description | Number of Figure Data Items | Identifier | Download Figure Details | ||
|---|---|---|---|---|---|---|---|
| Figure1 | Deuterium plasma exposure system after commissioning | 0 | CF/19/163 | Download | |||
| Figure2 | Piping and Instrumentation Diagram (P&ID) of deuterium exposure system | 0 | CF/19/164 | Download | |||
| Figure3 | An ellipsometry survey of an a-C:H foil exposed to 100 eV deuterium ions for 20 minutes. Region (i) shows approximately uniform erosion by the beam in the central area where the sample is located. Region (ii) shows where the left-hand retaining clip held the foil in place, and similarly the imprint of the right-hand clip can be seen to the right of the figure. Region (iii) shows where the top of the foil was shielded from the ion flux by a molybdenum foil shield and so the amount of erosion reduces sharply | 0 | CF/19/165 | Download | |||
| Figure4 | Photographs of commissioning plasmas. From left to right these are neon, helium, air and argon. The divergence of the ion beam can be observed. | 0 | CF/19/166 | Download | |||
| Figure5 | The ratio of ions incident on the inner and outer plates, providing an indication of beam divergence. The ratio of the areas of these plates is 0.7 | 0 | CF/19/167 | Download | |||
| Figure6 | An example spectrum taken during the exposure of a sample using recirculating deuterium. The D? and D? lines can be seen at 486 nm and 656 nm respectively, along with the Fulcher band between 560 nm and 640 nm. This spectrum indicates no significant buildup of impurities caused by re-circulation of the deuterium through the plasma chamber, suggesting deuterium results can be compared with those from other systems which typically have a ‘once through’ setup and exhaust the deuterium from the exposure chamber. | 0 | CF/19/168 | Download | |||
| Figure7 | TDS spectra of deuterium and exposure charge in Eurofer samples with damage levels between 0 and 1 dpa. Time period between exposure to deuterium plasma and the TDS is 1 day for all samples. The lower limit of the charge incident on the sample is indicated. It can be seen that the retention is more strongly affected by the damage level than the ion fluence. | 0 | CF/19/169 | Download | |||
| Figure8 | SIMS depth profiling of deuterium content of damaged Eurofer samples. Irradiation doses: S6 – 0 dpa, S15 – 0.01 dpa, S27 – 0.1 dpa, and S33 – 1 dpa. Time delay between exposure to deuterium plasma and the SIMS is given in days. | 0 | CF/19/170 | Download | |||
| Figure9a | TEM in-situ pictures of Eurofer sample irradiated to 1 dpa. Initial microstructure (a) | 0 | CF/19/171 | Download | |||
| Figure9b | TEM in-situ pictures of Eurofer sample irradiated to 1 dpa. Initial microstructure (a), microstructure at 625°C indicating cavities formed along grain boundaries and precipitates by change of contrast (b,c). | 0 | CF/19/172 | Download | |||
| Figure9c | TEM in-situ pictures of Eurofer sample irradiated to 1 dpa. Initial microstructure (a), microstructure at 625°C indicating cavities formed along grain boundaries and precipitates by change of contrast (b,c). | 0 | CF/19/173 | Download | |||
| Figure10 | TDS spectra of deuterium in Fe-Cr samples with damage levels between 0 and 1 dpa. Irradiation doses: S128 – 0 dpa, S51 – 0.01 dpa, S57 – 0.1 dpa, and S64 – 1 dpa. | 0 | CF/19/174 | Download | |||
| Figure11 | SIMS depth profiling of deuterium content of damaged Fe-Cr samples. For S50, S56 and S62 the delays were 59, 55 and 57 days respectively. | 0 | CF/19/175 | Download | |||
| Figure12 | The total retention in Eurofer and Fe-Cr samples as a function of delay between exposure and analysis. | 0 | CF/19/176 | Download | |||
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